Aplicación de la dispersión Compton para analizar la interacción de la radiación electromagnética ionizante con un polimetilmetacrilato (PMMA)

Abstract

This work presents an analysis of the interaction of radiation on a polymethylmethacrylate (PMMA) scattering material by means of Compton scattering. An aluminium absorber was used as the interaction process in which the incident rays are transmitted and diffracted in a single crystal; for Compton scattering, the analyser crystal was replaced by a scattering crystal, obtaining scattered and non-scattered transmission radiation, which allows us in order to determine the length of the scattered electron as a radiation interaction process. As a source of radiation generation and emission, an X-ray machine "XR 4.0 X-RAY EXPERENT UNIT, 35 KV" was used as the X-ray source and emitter, which allows the parameters of the X-ray production to be set to simulate radiation interaction processes with a Cu X-ray tube voltage of 35 KeV and an emission current of 1 mA. The radiation measurements are detected in a Geiger Müller counter tube, the results for the characterisation of anode characteristic X-rays are presented in a spectrum, while for the analysis of Compton scattering radiation, the transmission behaviour is determined before and after interacting with an absorber, and under the behaviour of the transmission curve the Compton shift was determined as a scattering process in the radiation interaction. As a technique to analyse characteristic radiation, spectroscopy, which describes the diffracted radiation path, was used. Furthermore, the device and its components are described as a radiation source and interdisciplinary instrument for tests in physics or medicine such as radiodiagnostics, which is based on the principles of interaction of radiation with matter, and also contains information on the phenomena of the action of radiation on matter.